| 摘要 |
PROBLEM TO BE SOLVED: To improve inspection accuracy and inspection efficiency.SOLUTION: The inspection data creation device is configured to be able to create inspection data De inclusive of information designating an inspection point P subjected to a measurement target and information indicative of a reference value upon inspection of a circuit substrate 100 provided with an electronic component 103 mounted on a substrate 101 having a conductor pattern 102 on the basis of a measurement value Rm of an electric parameter measured at the inspection point P provided on the conductor pattern 102 in the circuit substrate 100 and a reference value of the electric parameter. The inspection data creation device comprises: a storage unit 17 that stores circuit design data Dd indicative of a circuit configuration of the circuit substrate 100 including information about the conductor pattern 102 and information about the electronic component 103; and a processing unit 19 that executes a simulation process of simulating an operation of the circuit substrate 100 on the basis of the circuit design data Dd. The processing unit 19 creates the inspection data De on the basis of the circuit design data Dd. |
