<p>The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.</p>
申请公布号
EP2411820(A4)
申请公布日期
2013.10.16
申请号
EP20100756871
申请日期
2010.03.25
申请人
DELAWARE CAPITAL FORMATION, INC.
发明人
CHABINEAU-LOVGREN, SCOTT;SARGEANT, STEVE, B.;SWART, MARK, A.