| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which an overcurrent protection circuit is improved in detection precision while a wiring resistance component is used as a sense resistance. SOLUTION: The semiconductor device is constituted by integrating the sense resistance Rs as the wiring resistance component of a current line to be monitored, the overcurrent protection circuit OCP which compares a voltage drop across the sense resistance Rs with a predetermined threshold voltage to generate an overcurrent protection signal Socp, a dummy resistance Rd which is a wiring resistance component of a dummy line formed in the same process as the forming process of the current line, electrically separated from other circuit elements and has a larger resistance value than the sensor resistance Rs, and dummy pads T1 and T2 connected to both ends of the dummy resistance Rd, the overcurrent protection circuit OCP being configured to have a threshold voltage adjustment portion for adjusting the threshold voltage. COPYRIGHT: (C)2010,JPO&INPIT
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