发明名称 Semiconductor integrated circuit device having impurities introduced in back gate semiconductor regions
摘要 A bulk & SOI hybrid CMIS device, in which an I/O bulk part and a core logic SOI part are mounted, needs a number of gate stacks to optimize threshold voltage control and causes a problem that the process and structure become complicated. The present invention adjusts the threshold voltage of MISFET at the corresponding part by introducing impurities into any of back gate semiconductor regions, in an SOI semiconductor CMISFET integrated circuit device having a high-k gate insulating film and a metal gate electrode.
申请公布号 US8558312(B2) 申请公布日期 2013.10.15
申请号 US201113311294 申请日期 2011.12.05
申请人 IWAMATSU TOSHIAKI;RENESAS ELECTRONICS CORPORATION 发明人 IWAMATSU TOSHIAKI
分类号 H01L27/12;H01L27/085 主分类号 H01L27/12
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