发明名称 Charged particle beam device
摘要 The present invention provides a charged particle beam device in which the change of expansion/contraction of a specimen which is an observing object is restricted thereby eliminating position deviation of the observing object and significantly increasing its throughput. The present invention includes specimen holding means for holding a specimen, temperature regulation means which can regulate the temperature of the specimen, and temperature regulation means control means which can control the temperature regulation means based on various conditions.
申请公布号 US8558193(B2) 申请公布日期 2013.10.15
申请号 US201013382396 申请日期 2010.05.14
申请人 MAEDA SHUSAKU;ISHIGURO KOUJI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MAEDA SHUSAKU;ISHIGURO KOUJI
分类号 G01N23/225 主分类号 G01N23/225
代理机构 代理人
主权项
地址