发明名称 |
Testing of analog-to-digital converters |
摘要 |
Complete testing of an analog-to-digital converter (ADC) can be carried out using digital signals and at high speeds. Circuit elements are added to an ADC so that a first phase of testing may be carried out using a limited number of analog test voltages. The ADC may then be reconfigured using added circuit elements to disable conventional analog-to-digital conversion. A digital signal may then be applied to the ADC to rapidly test all switching elements used in analog-to-digital conversion. According to some implementations, testing times for ADCs may be reduced from hours to milliseconds.
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申请公布号 |
US8558726(B2) |
申请公布日期 |
2013.10.15 |
申请号 |
US201113339649 |
申请日期 |
2011.12.29 |
申请人 |
CHEONG CHEE WENG;TAN KIEN BENG;STMICROELECTRONICS ASIA PACIFIC PTE. LTD. |
发明人 |
CHEONG CHEE WENG;TAN KIEN BENG |
分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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