发明名称 Semiconductor device and fabrication process thereof
摘要 A semiconductor device includes a semiconductor substrate formed with an active element, an oxidation resistant film formed over the semiconductor substrate so as to cover the active element, a ferroelectric capacitor formed over the oxidation resistance film, the ferroelectric capacitor having a construction of consecutively stacking a lower electrode, a ferroelectric film and an upper electrode, and an interlayer insulation film formed over the oxidation resistance film so as to cover the ferroelectric capacitor, wherein there are formed, in the interlayer insulation film, a first via-plug in a first contact hole exposing the first electrode and a second via-plug in a second contact hole exposing the lower electrode, and wherein there is formed another conductive plug in the interlayer insulation film in an opening exposing the oxidation resistant film.
申请公布号 US8558294(B2) 申请公布日期 2013.10.15
申请号 US20080126357 申请日期 2008.05.23
申请人 SASHIDA NAOYA;FUJITSU SEMICONDUCTOR LIMITED 发明人 SASHIDA NAOYA
分类号 H01L27/105 主分类号 H01L27/105
代理机构 代理人
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