发明名称 Semiconductor device with dual metal silicide regions and methods of making same
摘要 Disclosed herein are various semiconductor devices with dual metal silicide regions and to various methods of making such devices. In one example, the device includes a gate electrode and a plurality of source/drain regions formed in a substrate proximate the gate electrode structure. The device further includes a first metal silicide region formed in each of the source/drain regions, wherein the first metal silicide region has an inner boundary and a second metal silicide region formed in each of the source/drain regions, wherein the second metal silicide region is positioned laterally between the inner boundary of the first metal silicide region and an edge of the gate electrode structure.
申请公布号 US8558290(B2) 申请公布日期 2013.10.15
申请号 US201113217975 申请日期 2011.08.25
申请人 SCHEIPER THILO;FLACHOWSKY STEFAN;GLOBALFOUNDRIES INC. 发明人 SCHEIPER THILO;FLACHOWSKY STEFAN
分类号 H01L21/82;H01L21/76;H01L23/051;H01L29/10;H01L29/66;H01L29/76 主分类号 H01L21/82
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