发明名称 Low leakage capacitor for analog floating-gate integrated circuits
摘要 An analog floating-gate electrode in an integrated circuit, and method of fabricating the same, in which trapped charge can be stored for long durations. The analog floating-gate electrode is formed in a polycrystalline silicon gate level, and includes portions serving as a transistor gate electrode, a plate of a metal-to-poly storage capacitor, and a plate of poly-to-active tunneling capacitors. Silicide-block silicon dioxide blocks the formation of silicide cladding on the electrode, while other polysilicon structures in the integrated circuit are silicide-clad.
申请公布号 US8558296(B2) 申请公布日期 2013.10.15
申请号 US201113070222 申请日期 2011.03.23
申请人 KHAN IMRAN MAHMOOD;MITCHELL ALLAN T.;LIU KAIPING;TEXAS INSTRUMENTS INCORPORATED 发明人 KHAN IMRAN MAHMOOD;MITCHELL ALLAN T.;LIU KAIPING
分类号 H01L27/108 主分类号 H01L27/108
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