发明名称 PLASMA PROCESS, FILM DEPOSITION METHOD AND SYSTEM USING ROTARY CHUCK
摘要 PURPOSE: A plasma process capable of reducing production costs, a film deposition method and a system using a rotary chuck are provided to reduce the non-uniformity of film thickness by rotating a wafer in a deposition process. CONSTITUTION: A chuck is formed in a plasma process chamber. A wafer is mounted on the chuck (410). Plasma is generated in the plasma process chamber. A plasma process using the plasma is performed on the wafer (420). The wafer mounted on the chuck is rotated. [Reference numerals] (410) Wafer is supported on a chuck in a plasma process chamber; (420) Plasma is formed within the plasma process chamber by rotating the chuck and wafer during a plasma process and the formed plasma is used for performing the plasma process on the wafer
申请公布号 KR20130112657(A) 申请公布日期 2013.10.14
申请号 KR20120088973 申请日期 2012.08.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YANG YU LUNG;XIAO YING;LIN CHIN HSIANG
分类号 H01L21/205;H01L21/687 主分类号 H01L21/205
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