发明名称 |
PLASMA PROCESS, FILM DEPOSITION METHOD AND SYSTEM USING ROTARY CHUCK |
摘要 |
PURPOSE: A plasma process capable of reducing production costs, a film deposition method and a system using a rotary chuck are provided to reduce the non-uniformity of film thickness by rotating a wafer in a deposition process. CONSTITUTION: A chuck is formed in a plasma process chamber. A wafer is mounted on the chuck (410). Plasma is generated in the plasma process chamber. A plasma process using the plasma is performed on the wafer (420). The wafer mounted on the chuck is rotated. [Reference numerals] (410) Wafer is supported on a chuck in a plasma process chamber; (420) Plasma is formed within the plasma process chamber by rotating the chuck and wafer during a plasma process and the formed plasma is used for performing the plasma process on the wafer |
申请公布号 |
KR20130112657(A) |
申请公布日期 |
2013.10.14 |
申请号 |
KR20120088973 |
申请日期 |
2012.08.14 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
YANG YU LUNG;XIAO YING;LIN CHIN HSIANG |
分类号 |
H01L21/205;H01L21/687 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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