| 摘要 |
DEVICE FOR AUTOMATICALLY TESTING ELECTRONIC COMPONENTS, COMPRISING A TESTING STATION (7) FOR TESTING AN ELECTRONIC COMPONENT (8) AND AT LEAST ONE SUPPORT (2) FOR HOLDING THE ELECTRONIC COMPONENT (8). THE SUPPORT HOLDS THE ELECTRONIC COMPONENT (8) BY ITS LOWER SIDE AND TWO OPPOSITE LATERAL SIDES SO THAT THE UPPER SIDE AND AT LEAST TWO LATERAL SIDES OF THE ELECTRONIC COMPONENT (8) ARE ENTIRELY ACCESSIBLE WHEN IT IS HELD ON THE SUPPORT (2). THESE SIDES BEING ENTIRELY ACCESSIBLE, THE POSSIBILITIES OF CONTACTING THE CONTACT POINTS (80) OF THE ELECTRONIC COMPONENT (8) TO BE TESTED AND LOCATED ON THESE SIDES ARE MORE NUMEROUS, ALLOWING SIMULTANEOUSLY FOR EXAMPLE AN ELECTRIC KELVIN-TYPE MEASURING AND AN OPTIC MEASURING ON LIGHT-EMITTING DIODES OF VERY SMALL SIZE. |
