发明名称 DUAL LANE TEST APPARATUS FOR SURFACE MOUNTED PART
摘要 PURPOSE: A dual lane inspection facility for a surface mounted component is provided to enable the inspection of products from two production lines at the same time by being placed at the two surface mounted component production lines. CONSTITUTION: A first inspection rail (100) has a first inlet, a first inspection unit, and a first outlet (150). The first inspection rail transfers inspection objects in a first direction. The first inspection rail section is installed on a base plate. A second inspection rail (300) faces the first inspection rail. The second inspection rail is installed on the base plate along the first direction.
申请公布号 KR20130112375(A) 申请公布日期 2013.10.14
申请号 KR20120034693 申请日期 2012.04.04
申请人 PEMTRON CO., LTD. 发明人 CHO, CHEOL HOON;YOO, YOUNG WOONG;KIM, JONG WON;CHOI, DO HWA;KIM, HEE WON
分类号 H05K13/08;G01B11/00;H05K13/04 主分类号 H05K13/08
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