发明名称 |
DUAL LANE TEST APPARATUS FOR SURFACE MOUNTED PART |
摘要 |
PURPOSE: A dual lane inspection facility for a surface mounted component is provided to enable the inspection of products from two production lines at the same time by being placed at the two surface mounted component production lines. CONSTITUTION: A first inspection rail (100) has a first inlet, a first inspection unit, and a first outlet (150). The first inspection rail transfers inspection objects in a first direction. The first inspection rail section is installed on a base plate. A second inspection rail (300) faces the first inspection rail. The second inspection rail is installed on the base plate along the first direction. |
申请公布号 |
KR20130112375(A) |
申请公布日期 |
2013.10.14 |
申请号 |
KR20120034693 |
申请日期 |
2012.04.04 |
申请人 |
PEMTRON CO., LTD. |
发明人 |
CHO, CHEOL HOON;YOO, YOUNG WOONG;KIM, JONG WON;CHOI, DO HWA;KIM, HEE WON |
分类号 |
H05K13/08;G01B11/00;H05K13/04 |
主分类号 |
H05K13/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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