TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

摘要

PURPOSE: A test circuit and a semiconductor device including the same are provided to improve the accuracy of the test and the reliability of the semiconductor device. CONSTITUTION: A semiconductor device (1) comprises a through via test part (100) and a test measurement unit (200). The through via test part is set to a first resistance value in response to a first test control signal, is set to a second resistance value in response to a second test control signal, and forms a current path with a through via. The through via electrically connects first and second chips. The test measurement unit measures supplies a test voltage to the through via test part and measures the amount of current flowing through the through via. [Reference numerals] (200) Test measurement unit; (300) Test control unit