发明名称 METHOD FOR MANUFACTURING OF SEMICONDUCTOR
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device is provided to reduce process costs by using a spin coating method for forming a dielectric layer. CONSTITUTION: A semiconductor layer is formed on a substrate. A dielectric material is formed on the semiconductor layer by a spin coating process. A spin coating layer is formed by the spin coating process (S130). Electrodes are formed on the semiconductor layer and the spin coating layer (S140). A passivation layer is formed on the semiconductor layer, the electrodes, and the spin coating layer (S150). [Reference numerals] (S110) Buffer layer is formed on a substrate; (S120) Semiconductor layer is formed on the buffer layer; (S130) Spin coating layer is formed by spin-coating an SOD material the semiconductor layer; (S140) Multiple electrodes are formed on the semiconductor layer and the spin coating layer; (S150) Passivation layer is formed on the multiple electrodes and the spin coating layer</p>
申请公布号 KR101316112(B1) 申请公布日期 2013.10.11
申请号 KR20120090969 申请日期 2012.08.20
申请人 DONGGUK UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION 发明人 KIM, SAM DONG;KO, PIL SEOK;JUNG, SUNG HO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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