发明名称 |
METHOD FOR MANUFACTURING OF SEMICONDUCTOR |
摘要 |
<p>PURPOSE: A method for manufacturing a semiconductor device is provided to reduce process costs by using a spin coating method for forming a dielectric layer. CONSTITUTION: A semiconductor layer is formed on a substrate. A dielectric material is formed on the semiconductor layer by a spin coating process. A spin coating layer is formed by the spin coating process (S130). Electrodes are formed on the semiconductor layer and the spin coating layer (S140). A passivation layer is formed on the semiconductor layer, the electrodes, and the spin coating layer (S150). [Reference numerals] (S110) Buffer layer is formed on a substrate; (S120) Semiconductor layer is formed on the buffer layer; (S130) Spin coating layer is formed by spin-coating an SOD material the semiconductor layer; (S140) Multiple electrodes are formed on the semiconductor layer and the spin coating layer; (S150) Passivation layer is formed on the multiple electrodes and the spin coating layer</p> |
申请公布号 |
KR101316112(B1) |
申请公布日期 |
2013.10.11 |
申请号 |
KR20120090969 |
申请日期 |
2012.08.20 |
申请人 |
DONGGUK UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION |
发明人 |
KIM, SAM DONG;KO, PIL SEOK;JUNG, SUNG HO |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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