发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 A method of fabricating a semiconductor device includes forming switching devices on a substrate. A lower structure is formed in the substrate having the switching devices. A lower conductive layer is formed on the lower structure. Sacrificial mask patterns are formed on the lower conductive layer. Lower conductive patterns are formed by etching the lower conductive layer using the sacrificial mask patterns as an etch mask. An interlayer insulating layer is formed on the substrate having the lower conductive patterns. Interlayer insulating patterns are formed by planarizing the interlayer insulating layer until the sacrificial mask patterns are exposed. Openings exposing the lower conductive patterns are formed by removing the exposed sacrificial mask patterns. Upper conductive patterns self-aligned with the lower conductive patterns are formed in the openings.
申请公布号 US2013267088(A1) 申请公布日期 2013.10.10
申请号 US201313795807 申请日期 2013.03.12
申请人 BAEK JONG-MIN;PARK IN-SUN;LEE JONG-MYEONG;HONG JONG-WON;KIM HEI-SEUNG;YOON JUNG-SOO 发明人 BAEK JONG-MIN;PARK IN-SUN;LEE JONG-MYEONG;HONG JONG-WON;KIM HEI-SEUNG;YOON JUNG-SOO
分类号 H01L21/768 主分类号 H01L21/768
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