INSPECTION DEVICE AND IMAGING ELEMENT

摘要

PROBLEM TO BE SOLVED: To provide an inspection device capable of acquiring large image data at a high speed while suppressing an increase in size of a circuit, and an imaging element used for the inspection device.SOLUTION: Imaging elements 32L and 32H used for an inspection device include: a plurality of photoelectric output-type photoelectric elements 33; a plurality of sample hold circuits 34b respectively connected to the corresponding photoelectric element 33; an analog multiplexer 34c connected to the plurality of sample hold circuits 34b; an analog-digital conversion circuit 34d connected to the analog multiplexer 34c; and a package 35 that accommodates these components.