发明名称 METAL GATE SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THEREOF
摘要 <p>PURPOSE: A metal gate semiconductor device and a manufacturing method thereof are provided to reduce manufacturing costs by removing a metal layer depositing process, an etching process, and a metal CMP process. CONSTITUTION: A first work function metal layer is formed on a first region (202) of a substrate (206). A metal layer is formed on a second region (204) and the first work function metal layer. A dummy layer (606) is formed on the metal layer. A first gate structure is formed on the first region. A second gate structure is formed on the second region. The metal layer is exposed by removing the dummy layer. The metal layer is processed.</p>
申请公布号 KR20130111174(A) 申请公布日期 2013.10.10
申请号 KR20120117946 申请日期 2012.10.23
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHUANG HARRY HAK LAY;ZHU MING;LIN HUI WEN;YOUNG BAO RU
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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