发明名称 |
METAL GATE SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THEREOF |
摘要 |
<p>PURPOSE: A metal gate semiconductor device and a manufacturing method thereof are provided to reduce manufacturing costs by removing a metal layer depositing process, an etching process, and a metal CMP process. CONSTITUTION: A first work function metal layer is formed on a first region (202) of a substrate (206). A metal layer is formed on a second region (204) and the first work function metal layer. A dummy layer (606) is formed on the metal layer. A first gate structure is formed on the first region. A second gate structure is formed on the second region. The metal layer is exposed by removing the dummy layer. The metal layer is processed.</p> |
申请公布号 |
KR20130111174(A) |
申请公布日期 |
2013.10.10 |
申请号 |
KR20120117946 |
申请日期 |
2012.10.23 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHUANG HARRY HAK LAY;ZHU MING;LIN HUI WEN;YOUNG BAO RU |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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