发明名称 |
IMAGING POSITION VARIATION DETECTING METHOD FOR PROJECTION LENS, ADJUSTMENT METHOD FOR STAGE POSITION, IMAGING POSITION VARIATION DETECTING DEVICE FOR PROJECTION LENS, ADJUSTMENT DEVICE FOR STAGE POSITION, AND PROJECTION EXPOSURE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To correctly image a pattern image on a workpiece even when the temperature of a photographic lens changes.SOLUTION: A pattern formed on a mask 13 is projected and exposed on a workpiece 14 on a stage 12 by a projection lens 10. At a reference time when the projection lens 10 has a predetermined temperature, a predetermined alignment mark 21 formed on the mask 13 is auto-focused and photographed by a camera 32 disposed between the projection lens and the stage. At the time of pre-exposure, which takes place before the exposure on the workpiece 14 on the stage 12, the alignment mark 21 is auto-focused and photographed by the camera 32 to obtain the amount of focus. A focus variation which is the difference between a photographic focusing position D0 at the reference time for the camera 32 and a photographic focusing position at the pre-exposure time is obtained. A variation in a pattern imaging position is obtained from the focus variation, and a position of the stage 12 in the direction of an optical axis is adjusted based on the variation. |
申请公布号 |
JP2013210440(A) |
申请公布日期 |
2013.10.10 |
申请号 |
JP20120079178 |
申请日期 |
2012.03.30 |
申请人 |
TOPCON CORP |
发明人 |
YOSHIDA SHIGERU;OCHIAI AKIRA;ENOMOTO YOSHIYUKI;ISHIBA YUKIO |
分类号 |
G03F7/20;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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