摘要 |
<p>A method for probabilistically predicting fatigue life in materials includes sampling (41) a random variable for an actual equivalent initial flaw size (EIFS), generating (42) random variables for parameters (InC, m) of a fatigue crack growth equation [Formula should be inserted here] from a multivariate distribution, and solving (43) the fatigue crack growth equation using these random variables. The reported EIFS data is obtained by ultrasonically scanning a target object, recording echo signals from the target object, and converting echo signal amplitudes to equivalent reflector sizes using previously recorded values from a scanned calibration block. The equivalent reflector sizes comprise the reported EIFS data.</p> |
申请人 |
SIEMENS CORPORATION;SIEMENS AKTIENGESELLSCHAFT;GUAN, XUEFEI;ZHANG, JINGDAN;KADAU, KAI;ZHOU, SHAOHUA, KEVIN |
发明人 |
GUAN, XUEFEI;ZHANG, JINGDAN;KADAU, KAI;ZHOU, SHAOHUA, KEVIN |