发明名称 |
SOL-GEL SOLUTION FOR FERROELECTRIC THIN FILM FORMATION |
摘要 |
PROBLEM TO BE SOLVED: To provide a sol-gel solution for ferroelectric thin film formation which makes possible to increase thickness of a layer formed by one coat according to a sol-gel method when forming a PZT-based ferroelectric thin film, and to arrange a PZT film having a crack-free, dense film structure even after preliminary and regular baking processes.SOLUTION: The sol-gel solution for ferroelectric thin film formation comprises: a PZT-based compound; a polyvinylpyrrolidone-containing polymer compound for viscosity control; and an organic dopant containing a formamide-based solvent. The sol-gel solution includes no less than 17 mass% of the PZT-based compound in terms of oxide. The molar ratio of the PZT-based compound to the polyvinylpyrrolidone is arranged so as to be 1:0.1 to 0.5 in terms of monomers. The formamide-based solvent accounts for 3-13 mass% of the sol-gel solution. The sol-gel solution arranged like this makes possible: to increase the thickness of a layer formed by one coat; to increase the production efficiency; and to form a dense film having no crack even after preliminary and regular baking processes. |
申请公布号 |
JP2013211309(A) |
申请公布日期 |
2013.10.10 |
申请号 |
JP20120078920 |
申请日期 |
2012.03.30 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
DOI TOSHIHIRO;SAKURAI HIDEAKI;WATANABE TOSHIAKI;SOYAMA NOBUYUKI |
分类号 |
H01L21/316;C01G25/00;H01G4/33;H01L21/31;H01L21/8246;H01L27/105;H01L41/09;H01L41/18;H01L41/22;H01L41/39 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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