| 摘要 |
A system employing vector signal generator (VSG) and vector signal analyzer (VSA) modules or cards that are configured to test multiple devices under test simultaneously. Each VSG is configured to generate multiple RF test signals and send them to multiple devices under test simultaneously. Similarly, each VSA is configured with multiple signal receiving modules connected to a single controller or memory. Each signal receiving module receives an RF signal from a device under test, converts it to a baseband digital signal, and transmits this digital signal to the VSA's memory. A single RF testing system can employ multiple such VSGs and VSAs, each capable of evaluating multiple devices under test. Each VSG/VSA can further be tuned for operation in discrete or defined frequency bands, which are narrower than those for conventional RF testers, and which can correspond to various wireless standards.
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