发明名称 SOLAR CELL ARRAY TESTING SYSTEM
摘要 <p>Proposed is a solar cell array testing system firstly capable of testing a parallel wiring type by a TDR system, secondly capable of being simply and easily obtained while being excellent in cost, and thirdly capable of being also expected to have an anti-surge effect. The testing system (12) identifies the presence or absence of a failure and other troubles of a solar cell array in which a plurality of strings (1) equipped with one or more modules (3) are connected in parallel. The testing system (12) has a testing device (11) and a delay means (13). Based on an outgoing signal to each of the strings (1) and a reflected signal from each of the strings (1), the testing device (11) separately identifies the presence or absence of a trouble of each of the strings (1). The delay means (13) sets the respective strings (1) to have a time-sequential front and rear relationship with each other with respect to either one of or both of the outgoing signal and the reflected signal and thereby sequentially inputs the reflected signals from the respective strings (1) to the testing device (11).</p>
申请公布号 WO2013151102(A1) 申请公布日期 2013.10.10
申请号 WO2013JP60236 申请日期 2013.04.03
申请人 SYSTEM JD CO., LTD. 发明人 OZAWA JUN
分类号 H01L31/04;G01R31/26 主分类号 H01L31/04
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