| 摘要 |
A spectrometer for determining a composition of a sample is described. The spectrometer includes a radiation source, a detector, and a processing device coupled to the radiation source and the detector. The radiation source is configured to generate a primary beam of radiation to be directed toward the sample. The detector is configured to generate a detector signal representative of a secondary beam of radiation from the sample after being impinged by the primary beam of radiation. The processing device is configured to control operation of the spectrometer in connection with performing a first elemental analysis of the sample. The processing device is also configured to determine an alloy grade of the sample based on the detector signal generated in connection with the first elemental analysis. Furthermore, the processing device is configured to determine at least one measurement condition based at least partially on the alloy grade. |
