发明名称
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a composition of an adhesive for sealing semiconductor devices, wherein the adhesive exhibits high insulation reliability by allowing the adhesive to have effects of suppressing occurrence of voids in connecting a semiconductor chip and a substrate at a high temperature of 200&deg;C or above and suppressing formation of electrically conductive substances by oxidation of tin plated on wiring lines of the substrate. <P>SOLUTION: The composition of the adhesive for sealing semiconductor devices includes (a) an epoxy resin, (b) a curing agent, and (c) an oxidation inhibitor. <P>COPYRIGHT: (C)2009,JPO&amp;INPIT</p>
申请公布号 JP5309886(B2) 申请公布日期 2013.10.09
申请号 JP20080271305 申请日期 2008.10.21
申请人 发明人
分类号 H01L21/60;C09J7/00;H01L23/29;H01L23/31 主分类号 H01L21/60
代理机构 代理人
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