发明名称 Dummy gate for a high voltage transistor device
摘要 The present disclosure provides a semiconductor device. The semiconductor device includes a first doped region and a second doped region both formed in a substrate. The first and second doped regions are oppositely doped. The semiconductor device includes a first gate formed over the substrate. The first gate overlies a portion of the first doped region and a portion of the second doped region. The semiconductor device includes a second gate formed over the substrate. The second gate overlies a different portion of the second doped region. The semiconductor device includes a first voltage source that provides a first voltage to the second gate. The semiconductor device includes a second voltage source that provides a second voltage to the second doped region. The first and second voltages are different from each other.
申请公布号 US8552495(B2) 申请公布日期 2013.10.08
申请号 US20100910000 申请日期 2010.10.22
申请人 TSAI YUNG-CHIH;LIN HAN-CHUNG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TSAI YUNG-CHIH;LIN HAN-CHUNG
分类号 H01L29/66;H01L21/336 主分类号 H01L29/66
代理机构 代理人
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