发明名称 METHOD FOR PREDICTING TEMPERATURE IN DEVICE
摘要 PURPOSE: A temperature prediction method of a device improves the performance of the device by maintaining the maximum allowable power for a CPU for a long time. CONSTITUTION: A temperature prediction circuit corresponding to a device including a semiconductor chip is provided (S1). A current-voltage correlation of the temperature prediction circuit is constructed (S2). The temperature for power applied to the device is predicted by using the current-voltage correlation of the temperature prediction circuit (S3). [Reference numerals] (AA) Start; (BB) End; (S1) Temperature prediction circuit corresponding to a device including a semiconductor chip is provided; (S2) Current-voltage correlation of the temperature prediction circuit is constructed; (S3) Temperature for power applied to the device is predicted by using the current-voltage correlation of the temperature prediction circuit
申请公布号 KR20130109788(A) 申请公布日期 2013.10.08
申请号 KR20120031819 申请日期 2012.03.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 IM, YUN HYEOK;PARK, KYOL;CHO, TAE JE
分类号 G05F1/567 主分类号 G05F1/567
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