发明名称 Method for calculating probe mounting position in on-machine measuring device
摘要 A measurement program is created for measurement performed by moving X- and Z-axes so that a central axis of a probe is perpendicular to the surface of a reference sphere, and errors are obtained between original probe position data and probe position data obtained by measurement performed at two different angles theta1 and theta2 of a rotary axis according to the created measurement program. Position coordinates of a tip end of the probe at the two different angles theta1 and theta2 of the rotary axis are corrected so that the errors are zero. Then, the X- and Z-axis coordinates are corrected based on a positive or negative phased shift amount, and measurement errors are obtained by calculation. A real probe tip position is defined by the X- and Z-axis coordinates corrected by a correction amount with which the obtained measurement errors become minimum.
申请公布号 US8554502(B2) 申请公布日期 2013.10.08
申请号 US201113026215 申请日期 2011.02.12
申请人 HON YONPYO;EBIHARA KENZO;HAMURA MASAYUKI;FANUC CORPORATION 发明人 HON YONPYO;EBIHARA KENZO;HAMURA MASAYUKI
分类号 G06F19/00 主分类号 G06F19/00
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