| 摘要 |
PURPOSE: A surface defect inspecting device and a control method thereof are provided to block optical noise generated by a target object, thereby enabling the detection of image information including the surface defect information of the target object. CONSTITUTION: A surface defect inspecting device (100) includes a stage unit (110), light source units (131, 132), a photographing unit (120), a control unit (140), and a display unit (150). A target object is placed on the top surface of the stage unit. The positions of the light sources are adjusted according to inspection conditions, and the light sources emit lights for inspection on the surface of the target object. The photographing unit receives the lights emitted by the surface of the target object, thereby photographing the surface images of the target object. The control unit, which is connected to the light source units and the photographing unit, sets and controls the inspection conditions and detects the surface defects of the target object by using the images photographed by the photographing unit. The display unit displays the image information in which the surface defects are detected. [Reference numerals] (140) Control unit |
