发明名称 METHOD OF DESIGNING PATTERN LAYOUTS
摘要 <p>PURPOSE: A method of designing a pattern layout forms a layout of the accurately corrected final pattern by separating a correction for compensating for an optical proximity effect and a correction for compensating for a light range effect. CONSTITUTION: First layouts of multiple chip regions are generated. Firstly corrected layouts of the chip regions are formed. Secondary corrected layouts of the chip regions are formed. The final layouts of the chip regions are formed. [Reference numerals] (AA) Generate initial layouts of more than two chip regions; (BB) Generate firstly-corrected layouts of the more than two chip regions; (CC) Generate secondly-corrected layouts of the more than two chip regions; (DD) Generate final layouts of the more than two chip regions</p>
申请公布号 KR20130109764(A) 申请公布日期 2013.10.08
申请号 KR20120031772 申请日期 2012.03.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG, MOON GYU
分类号 H01L21/027 主分类号 H01L21/027
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