发明名称 INSPECTION APPARATUS FOR CELL VOLTAGE MEASUREMENT SUBSTANCE
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of applying an accurate voltage to a cell voltage measurement substrate.SOLUTION: Feedback means 66 calculates a voltage value Vo of voltage output from a power source 10 so as to perform feedback control for making an input voltage value Vi measured by a voltmeter 20 for measuring a voltage input to a cell voltage measurement substrate A coincident with a set voltage value Vs. Switch group control means 68 controls changeover of a switch group 40 for switching a connection state and a non-connection state between each line of the cell voltage measurement substrate A and the power source 10.
申请公布号 JP2013205406(A) 申请公布日期 2013.10.07
申请号 JP20120078425 申请日期 2012.03.29
申请人 KEIHIN CORP 发明人 MATSUZAKA SHIGEHARU
分类号 G01R31/00;H01M10/48;H02J7/00 主分类号 G01R31/00
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