发明名称 SILICON CARBIDE SEMICONDUCTOR ELEMENT MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor element manufacturing method which enables low temperature formation and low resistance of an ohmic electrode on a rear face of a single crystal silicon carbide substrate.SOLUTION: A silicon carbide semiconductor element manufacturing method comprises: a process of forming on a rear face of a silicon carbide substrate, a first metal layer having a thickness of not to completely cover the rear face of the substrate; boring multiple holes in the rear face of the silicon carbide substrate by dry etching the rear face of the silicon carbide substrate by using the first metal layer as a mask; and a process of forming a second metal layer composing an ohmic electrode on the first metal layer and on the rear face of the silicon carbide substrate which includes the multiple holes.
申请公布号 JP2013207017(A) 申请公布日期 2013.10.07
申请号 JP20120073029 申请日期 2012.03.28
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;FUJI ELECTRIC CO LTD 发明人
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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