发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To satisfy both of suppression of increase in contact resistance and increase in withstanding voltage around an end of a groove.SOLUTION: A semiconductor device comprises: a groove GT which is provided in a semiconductor layer and at least between a source off-set region and a drain off-set region in planar view, and in a source-drain direction running from the source off-set region to the drain off-set region; a gate insulation film GI which covers lateral faces and a bottom face of the groove GT; a gate electrode GE which is provided at least in the groove GT in planar view and contacts the gate insulation film GI; and a contact GC which contacts the gate electrode GE. Further, the contact GC is arranged in such a manner as to be displaced from a center line in the groove GT extending in the source-drain direction in planar view, in a first direction perpendicular to the source-drain direction, and the contact GC is provided in the groove GT in planar view.
申请公布号 JP2013206945(A) 申请公布日期 2013.10.07
申请号 JP20120071527 申请日期 2012.03.27
申请人 RENESAS ELECTRONICS CORP 发明人 IGUCHI SOICHIRO
分类号 H01L21/336;H01L21/768;H01L21/8238;H01L23/522;H01L27/092;H01L29/78 主分类号 H01L21/336
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