| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that can detect whether or not a fuse storing address information of a defective memory cell is in a cut-off state, before a trimming step.SOLUTION: The semiconductor device comprises a test circuit 11 which outputs a test mode signal (fuse set selection test mode signals FSTM1 to FSTMn) to a fuse set circuit 12 when receiving a test address together with a test command, and causes the fuse set circuit to compare the test address with the address stored by the address specifying fuse and output address hit signals AH1 to AHn regardless of information stored by an enable fuse storing information indicating whether or not an address specifying fuse in the fuse set circuit 12 is used. |
