发明名称 METHOD AND APPARATUS FOR EVALUATING AND SELECTING SEMICONDUCTOR OPTICAL MODULATION ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for evaluating and selecting an optical modulation element, which can perform accurate evaluation and selection of the optical modulation element easily and quickly.SOLUTION: The method of the present invention, in first evaluation of the semiconductor optical modulation element, includes a step of: measuring output optical power and monitor current of the semiconductor optical modulation element for a voltage applied to a phase adjustment part, and obtaining and storing applied voltage-output optical power characteristics and first applied voltage-monitor current characteristics. In second evaluation of the semiconductor optical modulation element and thereafter, the method further includes the steps of: measuring the monitor current and obtaining second applied voltage-monitor current characteristics; obtaining a rate of change in the monitor current on the basis of the second applied voltage-monitor current characteristics for the first applied voltage-monitor current characteristics; and selecting a semiconductor optical modulation element having a rate of change satisfying a predetermined selection standard.
申请公布号 JP2013205772(A) 申请公布日期 2013.10.07
申请号 JP20120077348 申请日期 2012.03.29
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 SATOU RIEKO;SHIBATA YASUO
分类号 G02F1/025 主分类号 G02F1/025
代理机构 代理人
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