发明名称 SPECIMEN ANALYZER
摘要 PROBLEM TO BE SOLVED: To prevent decoloration of fluorescent light by performing a focusing operation in a short time.SOLUTION: A specimen analyzer comprises a specimen stage supporting a test piece, a light source, a plurality of divided sensors for detecting light generated in the test piece, an irradiation optical system which makes light emitted from the light source incident from an obliquely upper side to the test piece, a detection optical system which guides light generated in the test piece to the sensors, a lifting device which moves the specimen stage to change an interval between the test piece and the sensors, a control section, and a defocus characteristic data storage table in which characteristic data acquired from output signals of the sensors are made correspondent to the amount of correction that the lifting device should perform. The control section acquires characteristic data from output signals of the sensors and changes the interval by the lifting device on the basis of the correction amount corresponding to the data.
申请公布号 JP2013205135(A) 申请公布日期 2013.10.07
申请号 JP20120072813 申请日期 2012.03.28
申请人 KONICA MINOLTA INC 发明人 IMAI MAKOTO
分类号 G01N21/64;G01N33/52 主分类号 G01N21/64
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