发明名称 SYSTEM FOR THREE-DIMENSIONAL MEASUREMENT AND METHOD THEREFOR
摘要 PURPOSE: A three-dimensional (3D) measurement system and a method thereof are provided to perform high-precision 3D measurement by projecting a pattern using a grid pattern or a chess board shape pattern. CONSTITUTION: A coordinate calculation unit (410) calculates a 3D coordinate value from pattern image information photographed using a specific pattern. A depth value calculation unit (420) calculates the depth value of a first point from N luminance image information photographed by N different lighting devices. A third operation unit (422) averages M preparatory depth values of the first point from a second operation unit (421). A pre-extraction unit (411) extracts a boundary line of grid cell comprising a specific pattern. A first operation unit (412) calculates the depth value of the boundary line from distortion of the boundary. [Reference numerals] (400) Calculation device; (410) Coordinate calculation unit; (411) Pre-extraction unit; (412) First operation unit; (420) Depth value calculation unit; (421) Second operation unit; (422) Third operation unit
申请公布号 KR101314101(B1) 申请公布日期 2013.10.04
申请号 KR20120105628 申请日期 2012.09.24
申请人 WIPCO LIMITED;CHO, CHANG SUK 发明人 CHO, CHANG SUK
分类号 H04N13/02 主分类号 H04N13/02
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