发明名称 PROCÉDÉ DE RÉALISATION D'UNE STRUCTURE A COUCHE MÉTALLIQUE ENTERRÉE
摘要 The invention relates to a method for fabricating a structure including a semiconductor material comprising: a) implanting one or more ion species to form a weakened region delimiting at least one seed layer in a substrate of semiconductor material, b) forming, before or after step a), at least one metallic layer on the substrate in semiconductor material, c) assembling the at least one metallic layer with a transfer substrate, then fracturing the implanted substrate at the weakened region, and d) forming at least one layer in semiconductor material on the at least one seed layer, for example, by epitaxy.
申请公布号 FR2967813(B1) 申请公布日期 2013.10.04
申请号 FR20100059476 申请日期 2010.11.18
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 BETHOUX JEAN-MARC;GUENARD PASCAL
分类号 H01L21/762;H01L21/20;H01L21/60;H01L31/18;H01L33/00 主分类号 H01L21/762
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