发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To manufacture a semiconductor device using an oxide semiconductor, which can achieve stable electrical characteristics and high reliability.SOLUTION: A manufacturing processes of a semiconductor device including a bottom-gate transistor which has an oxide semiconductor layer comprises: forming a source electrode layer and a drain electrode layer in the island-like oxide semiconductor layer which overlaps a gate electrode layer; and subsequently performing a heat treatment under reduced pressure and at a temperature of hydrogen or a hydrogen compound being removed from the oxide semiconductor layer or at a temperature more than the hydrogen removal temperature.
申请公布号 JP2013201430(A) 申请公布日期 2013.10.03
申请号 JP20130032113 申请日期 2013.02.21
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;KAMINAGA MASAMI;IKEYAMA TERUMASA;HIZUKA JUNICHI;OKAZAKI KENICHI
分类号 H01L21/336;G02F1/1368;G09F9/00;G09F9/30;H01L29/786;H01L51/50 主分类号 H01L21/336
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