发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To manufacture a semiconductor device using an oxide semiconductor, which can achieve stable electrical characteristics and high reliability.SOLUTION: A manufacturing processes of a semiconductor device including a bottom-gate transistor which has an oxide semiconductor layer comprises: forming a source electrode layer and a drain electrode layer in the island-like oxide semiconductor layer which overlaps a gate electrode layer; and subsequently performing a heat treatment under reduced pressure and at a temperature of hydrogen or a hydrogen compound being removed from the oxide semiconductor layer or at a temperature more than the hydrogen removal temperature. |
申请公布号 |
JP2013201430(A) |
申请公布日期 |
2013.10.03 |
申请号 |
JP20130032113 |
申请日期 |
2013.02.21 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;KAMINAGA MASAMI;IKEYAMA TERUMASA;HIZUKA JUNICHI;OKAZAKI KENICHI |
分类号 |
H01L21/336;G02F1/1368;G09F9/00;G09F9/30;H01L29/786;H01L51/50 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|