发明名称 MICROSCOPE SPECTROMETER, OPTICAL AXIS SHIFT CORRECTION DEVICE, SPECTROSCOPE AND MICROSCOPE USING SAME
摘要 A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
申请公布号 US2013258332(A1) 申请公布日期 2013.10.03
申请号 US201313897981 申请日期 2013.05.20
申请人 YOKOGAWA ELECTRIC CORPORATION 发明人 IGA MITSUHIRO
分类号 G01J3/44 主分类号 G01J3/44
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