发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE PROCESSING METHOD, SUBSTRATE PROCESSING APPARATUS, AND PROGRAM |
摘要 |
<p>Provided is a semiconductor device manufacturing method wherein, at the time of forming a film on a substrate at a low temperature, fine patterning is performed by improving film qualities. This semiconductor device manufacturing method has: a step wherein a film is formed on a substrate by alternately supplying at least a raw material gas and a reaction gas to the substrate, while maintaining the substrate at a first temperature by heating the substrate; and a step wherein, while naturally cooling the substrate having the film formed thereon to a second temperature that is lower than the first temperature in a state wherein the substrate is not heated, the film is modified by supplying a plasma-excited modification gas to the substrate having the film formed thereon.</p> |
申请公布号 |
WO2013146632(A1) |
申请公布日期 |
2013.10.03 |
申请号 |
WO2013JP58488 |
申请日期 |
2013.03.25 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
NODA, TAKAAKI;HANASHIMA, TAKEO |
分类号 |
H01L21/31;C23C16/42;C23C16/56;H01L21/316 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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