| 摘要 |
<p>The invention relates to an inspection method for detecting thin defects on transparent containers (2) having a central axis (A), the method comprising, for a series of inspection points distributed over an inspection region in a stacked manner according to a predetermined height of the container taken along the central axis (A) and along the circumference of the container: sending a light beam (9) so as to collect, on a light sensor (16), the beams reflected (12, 11) by the inner (6) and outer (5) surfaces of the wall of the container; measuring, at each inspection point, the thickness of the wall (3) according to the separation, at the light sensor (16), between the beams reflected by the inner and outer surfaces; and processing the thickness measurements by analysing the distribution thereof over the inspection region in order to extract the geometric features thereof, and comparing said geometric features with reference values in order to determine whether the container has a defect in the material distribution thereof.</p> |
