| 摘要 |
A method for reducing artifacts produced by x-ray radiation directly striking a measuring pixel of a CMOS detector after crossing a scintillator, wherein, for an x-ray image recorded using the CMOS detector, artifact image points are extracted by applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point and comparison with the image to which the smoothing operator was applied, and their image data is corrected.
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