发明名称 SILICON CARBIDE SEMICONDUCTOR ELEMENT AND METHOD FOR PRODUCING SAME
摘要 A method for producing a silicon carbide semiconductor element comprising a drift layer that has the role of maintaining high pressure resistance on the front surface side of a semiconductor substrate formed from silicon carbide and an ohmic electrode on the back surface side of the semiconductor substrate comprises the additional step of, prior to forming the ohmic electrode on the back surface side of the semiconductor substrate, dicing the element active region on the surface of the side opposite the drift layer of the semiconductor substrate such that there is at least one dicing line. As a result, provided are a silicon carbide semiconductor element having a structure with which substrate strength is retained, even when the semiconductor substrate is thin in order to lower on-resistance, and wafer cracking during the wafer process can be minimized, as well as a method for producing the same.
申请公布号 WO2013146444(A1) 申请公布日期 2013.10.03
申请号 WO2013JP57738 申请日期 2013.03.18
申请人 FUJI ELECTRIC CO., LTD.;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY 发明人 TSUJI, TAKASHI;KINOSHITA, AKIMASA;FUKUDA, KENJI
分类号 H01L21/329;H01L21/28;H01L29/12;H01L29/47;H01L29/78;H01L29/868;H01L29/872 主分类号 H01L21/329
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