发明名称 INFRARED TEMPERATURE MEASUREMENT DEVICE, INFRARED TEMPERATURE MEASUREMENT METHOD, AND INFRARED TEMPERATURE MEASUREMENT DEVICE CONTROL PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide an infrared temperature measurement device for measuring temperature, and permitting more precise determination of presence of a heat generator.SOLUTION: An infrared temperature sensor unit 3 receives infrared rays emitted from an object present in a measurement target region, and measures temperature (a measured temperature value) in the measurement target region. A distance operation part 22 measures the distance to the object present in the measurement target region. A temperature correction part 23 corrects the measured temperature value on the basis of the distance, thereby calculating a corrected temperature value.
申请公布号 JP2013200137(A) 申请公布日期 2013.10.03
申请号 JP20120067115 申请日期 2012.03.23
申请人 OMRON CORP 发明人 UEDA NAOTSUGU;SHIIKI MASAKAZU;NAKAMURA TAKASHI
分类号 G01J5/48;G01K3/06;G01K7/00 主分类号 G01J5/48
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