发明名称 GAN SUBSTRATE, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 Provided are a GaN substrate, a semiconductor device and a manufacturing method thereof. The GaN substrate comprises: a GaN base (401); an AlGaN layer (402), arranged on the GaN base; and a p-type conductive layer (403), arranged on an active area of the AlGaN layer, and used for consuming surface state negative electrons on the AlGaN layer and neutralizing dangling bonds on the AlGaN layer. By forming the p-type conductive layer on the AlGaN layer, the n-type surface state negative electrons on the AlGaN layer can be consumed and the dangling bonds on the section on the AlGaN layer can be neutralized by hole carriers in the p-type conductive layer, so as to prevent the forming of a virtual gate, thereby suppressing the current collapse effect of the semiconductor device manufactured by the GaN substrate, improving the performance of the semiconductor device and improving the reliability thereof.
申请公布号 WO2013143289(A1) 申请公布日期 2013.10.03
申请号 WO2012CN84300 申请日期 2012.11.08
申请人 HUAWEI TECHNOLOGIES CO., LTD. 发明人 ZHANG, ZHENGHAI;ZHANG, ZONGMIN;CAO, BOCHENG
分类号 H01L29/06;H01L21/20;H01L21/335;H01L29/778 主分类号 H01L29/06
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