| 摘要 |
<p>Provided is a microchip optical measuring device that is capable of automatically adjusting, in a highly accurate manner, the position of a microchip relative to the optical axis of a laser. The microchip optical measuring device is provided with: an irradiation detection unit that detects light produced by projecting a laser on a microchip; a position adjustment unit that changes the relative position of the microchip with respect to the irradiation detection unit; and a control unit that outputs, to the position adjustment unit, a signal to move toward a position where an integrated value or average value of the detected intensity of the aforementioned light in a predetermined region becomes large.</p> |
