| 摘要 |
The detecting section (20) of a magnetic field probe (1) is provided with: a first wiring pattern (31), which is formed on the first surface (16) of a multilayer substrate (10), and which has a predetermined tilt (phi) with respect to the direction of the axis line (3) of the magnetic field probe (1); a second wiring pattern (32), which is formed on a second surface (17), and which has a predetermined tilt (phi) with respect to the direction of the axis line (3); and a first through via hole (41), which penetrates the multilayer substrate (10) in the thickness direction, and which connects the leading end portion (31b) of the first wiring pattern (31), and the leading end portion (32b) of a second wiring pattern (32) to each other. The rear end portion (31a) of the first wiring pattern (31) is connected to a conductor pattern (84) that constitutes a strip line (80), and the rear end portion (32b) of the second wiring pattern (32) is connected to ground patterns (82, 83), which constitute the strip line (80). |
