发明名称 EDGE TRIGGERED CALIBRATION
摘要 Circuitry for measuring a propagation delay in a circuit path. The circuitry includes a one-shot edge triggered element that can be connected in a loop with the circuit path. An edge signal propagating through the circuit path triggers the one-shot element to output a pulse. The pulse propagates around the loop, again triggering the one-shot element to produce a pulse, creating a repeating series of pulses. The period between these pulses is influenced by propagation time of an edge through the loop such that a difference in the period with the circuit path connected and not connected in the loop indicates propagation delay in the circuit path. Such circuitry can be configured to independently measure, and therefore calibrate for, propagation delays associated with rising and falling edges. Calibration to separately equalize propagation delays for rising and falling edges can increase the timing accuracy of an automatic test system.
申请公布号 US2013260485(A1) 申请公布日期 2013.10.03
申请号 US201213450123 申请日期 2012.04.18
申请人 VAN DER WAGT JAN PAUL ANTHONIE;SARTSCHEV RONALD A.;KANNALL GREGORY A.;TERADYNE, INC. 发明人 VAN DER WAGT JAN PAUL ANTHONIE;SARTSCHEV RONALD A.;KANNALL GREGORY A.
分类号 H01L21/66;G01R27/28;G01R35/00 主分类号 H01L21/66
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