发明名称 |
METHOD AND SYSTEM FOR PERFORMING ON-WAFER TESTING OF HEADS |
摘要 |
A method and system for testing a read transducer are described. The read transducer includes a read sensor fabricated on a wafer. A system includes a test structure that resides on the wafer. The test structure includes a test device and a heater. The test device corresponds to the read sensor. The heater is in proximity to the test device and is configured to heat the test device substantially without heating the read sensor. Thus, the test structure allows for on-wafer testing of the test device at a plurality of temperatures above an ambient temperature. |
申请公布号 |
US2013257421(A1) |
申请公布日期 |
2013.10.03 |
申请号 |
US201213436732 |
申请日期 |
2012.03.30 |
申请人 |
SHANG CHANGHE;MAURI DANIELE;HO KUOK SAN;WESTERN DIGITAL (FREMONT), LLC |
发明人 |
SHANG CHANGHE;MAURI DANIELE;HO KUOK SAN |
分类号 |
G01R31/28;G11B5/455 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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