发明名称 CONTACT STRUCTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A contact structure of a semiconductor device is provided to improve device performance by transferring enough the amount of strain to the inner part of a channel region. CONSTITUTION: A strained material (208) is arranged in a cavity. A first metal layer (222) is arranged on the strained material. A dielectric layer (224) is arranged on the first metal layer. The dielectric layer has a thickness of 1 to 10 nm. A second metal layer (228) is arranged on the dielectric layer.</p>
申请公布号 KR20130108025(A) 申请公布日期 2013.10.02
申请号 KR20120080042 申请日期 2012.07.23
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU CHENG HSIEN;KO CHIH HSIN;WANN CLEMENT HSINGJEN
分类号 H01L21/28;H01L21/336;H01L29/78 主分类号 H01L21/28
代理机构 代理人
主权项
地址