发明名称 |
CONTACT STRUCTURE OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A contact structure of a semiconductor device is provided to improve device performance by transferring enough the amount of strain to the inner part of a channel region. CONSTITUTION: A strained material (208) is arranged in a cavity. A first metal layer (222) is arranged on the strained material. A dielectric layer (224) is arranged on the first metal layer. The dielectric layer has a thickness of 1 to 10 nm. A second metal layer (228) is arranged on the dielectric layer.</p> |
申请公布号 |
KR20130108025(A) |
申请公布日期 |
2013.10.02 |
申请号 |
KR20120080042 |
申请日期 |
2012.07.23 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
WU CHENG HSIEN;KO CHIH HSIN;WANN CLEMENT HSINGJEN |
分类号 |
H01L21/28;H01L21/336;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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